Scrow Test Probe for ATEICTFCT, OD 0.48~6.00 mm, Diverse diameters

Crow Test Probe for ATEICTFCT, OD 0.48~6.00 mm, High precision

Cup Test Probe for ATEICTFCT, OD 0.48~6.00 mm, Highly conductive

Flat Test Probe for ATEICTFCT, OD 0.48~6.00 mm, Strong reliability

Test Probe for ATE/ICT/FCT, 0.48~6, Best Precision

Our Test Probe, designed for ATE/ICT/FCT testing. Features high precision, reliability, and a range of diameters. Durable, long-lasting, and highly conductive, it boosts testing efficiency. Compatible with various testing equipment to ensure comprehensive and accurate results. We offer tailored services and tech support to meet diverse needs, creating substantial value.

Product Features:

Precision design ensures accurate test data every time.
Super durable, reliable, and stable for long-term use.
Widely compatible with various testing devices and scenarios.
Excellent conductivity improves testing efficiency and stability.
Corrosion-resistant materials ensure long-lasting performance.
Personalized customization perfectly meets unique needs.

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Test Probe for ATE/ICT/FCT, OD 0.48~6.00 mm, Description

Product Info: The ICT/FCT/ATE Test Probe is designed with cutting-edge technology for maximum stability and durability, making it perfect for high-precision circuit testing. It lasts up to 200,000 uses, ensuring every test is accurate and reliable. The probe tip is made from high-quality alloy, able to withstand extreme heat and pressure, so it works flawlessly in harsh environments, guaranteeing efficiency and consistency.
Product Features: The Test Probe is highly elastic and wear-resistant, fitting various circuit boards without frequent replacements. It can handle current up to 50A, with a spring that bounces back strongly, keeping contact precision within 0.01mm. The probe tip is customizable to meet different size and shape needs, maximizing testing accuracy.
Problem Solved: Designed to tackle unstable signal transmission in complex circuit boards, the Test Probe captures weak signals precisely, reducing testing errors by over 50%. It’s especially effective for intricate, multi-layer boards, cutting down on repeated tests caused by poor contact, thus boosting overall testing efficiency.
Specifications: The Test Probe ranges > 0.12mm in diameter, with custom sizes available. It can withstand temperatures up to 300°C and respond at speeds of up to 1,000 tests per second. Its flexible design adapts to various circuit board needs, ensuring reliable performance in demanding industrial settings.
Successful Application: Widely used by leading semiconductor companies, the Test Probe excels in high-frequency, multi-layer board testing. With this Spring Probe, clients have seen a 30% increase in testing yield and a 50% drop in product return rates, saving over $1 million annually in rework and repair costs.
Target Industries: The ICT Test Probe is extensively used in electronics manufacturing, semiconductors, and automotive electronics, especially in fields demanding high testing accuracy and stable signal transmission. Whether for consumer electronics, industrial control, or medical devices, the ICT Test Probe is key to ensuring product quality.
Customer Benefits: Using the ICT Test Probe boosts testing efficiency by 30% and reduces waste by 20%, significantly cutting down on rework caused by inaccurate tests. Its precise and stable signal transmission saves customers valuable testing time and shortens time-to-market, leading to significant economic benefits and a competitive edge.

Test Probe for ATE/ICT/FCT, OD 0.48~6.00 mm, Datasheet

No.#	Categories	Specification Range	Unit	Purpose	Benefits	Applications
1	Barrel OD	0.26~3.50	mm	*	*	*
2	Plunger OD	0.12~2.50	mm	*	*	*
3	Plunger Tips	Crown, Round, Sharp, Flat, Dome	*	*	*	*
4	Length	≥3.00	mm	*	*	*
5	Stroke	≥0.40	mm	*	*	*
8	Voltage Rating	6V, 12V, or custom	V	*	*	*
9	Current Rating	≥0.5	A	*	*	*
10	Spring Force	≥15	gf	*	*	*
11	1. Plunger Tips Categories	Crown	*	For large or irregular test points	Provides stable and consistent contact on uneven or irregular surfaces. Reduces damage risk due to even pressure distribution.	Testing high-density ICs with irregular pin layouts. Testing large pads, complex semiconductors, and uneven surfaces.
12	2. Plunger Tips Categories	Round	*	For round or curved surfaces	Round tip provides a larger contact area for flexible or irregular surfaces.	Great for flexible circuits and irregular boards.
13	3. Plunger Tips Categories	Sharp	*	For very small, densely spaced test points	Accurate contact with minimal short-circuit risk. Essential for high-precision ICs and microelectronics.	Precision testing of small IC pins and fine circuits. Semiconductor testing and high-density component testing.
14	4. Plunger Tips Categories	Flat	*	For wide or flat test points	Ensures uniform contact on large pads, improving signal integrity. Reduces damage risk with even pressure distribution.	Board-level testing, pad testing, and electrical connection checks. Large pads and broad conductive areas.
15	5. Plunger Tips Categories	Dome	*	For slightly curved or uneven surfaces	Accommodates minor surface irregularities while maintaining good contact. Suitable for uneven or slightly curved surfaces.	Used in ATE and precision testing.

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Choose our test probe, ±0.02 mm precision, 50% more durability, 7-day delivery, 20% boost in test efficiency, and top-notch ASS for worry-free testing.

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Products Categories

Pogo Pins

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High Current Pogo Pins

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Solder Cup Pogo Pin

Right Angle Pogo Pin

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Pogo Pin Connector

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2 Pin Connector

3 Pin Connector

4 Pin Connector

5 Pin Connector

6 Pin Connector

7 Pin Connector

8 Pin Connector

10 Pin Connector

12 Pin Connector

Pogo Pin Connectors

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Test Probe for ATE/ICT/FCT, OD 0.48~6.00 mm, Applications

Precision Circuit Board Testing
Dense circuit boards need accurate testing. Tight spaces make probing tough. Our OD 0.48 mm Test Probe fits these tight spots. It increases testing efficiency by 40% and accuracy to 99%.
High-Frequency Signal Testing
High-frequency circuits are used for fast data. These signals can be disrupted. Our OD 0.80 mm Test Probe reduces interference. Signal stability goes up 30% and errors drop by 50%.
Automotive Electronics Testing
Car electronics need reliable testing. Harsh conditions demand robust probes. Our OD 1.20 mm Test Probe handles high heat and pressure. Reliability improves by 45% and repairs drop by 35%.
Consumer Electronics Testing
With smart devices on the rise, testing needs are high. Small size and various connectors make it tricky. Our OD 1.50 mm Test Pogo Pin fits many connectors. It speeds up testing by 50% and boosts efficiency by 40%.
Communication Equipment Testing
Communication devices need steady and precise testing. Complex signals need precise probes. Our OD 2.00 mm Test Probe handles these signals well. Testing accuracy improves by 35% and device stability by 25%.
Medical Device Testing
Medical devices require very precise testing. Probing must be damage-free. Our OD 3.00 mm Test Probe is flexible and safe. It boosts testing accuracy by 50% and reduces faults by 30%.
Industrial Control System Testing
Industrial controls need reliable testing. Tough environments require durable test probe. Our OD 4.00 mm Test Pogo Pinis built to last. It extends probe life by 40% and cuts system failures by 20%.
Aerospace Equipment Testing
Aerospace equipment has strict testing standards. Extreme conditions need tough test probe. Our OD 6.00 mm Test Pogo Pin works in harsh environments. Testing stability increases by 45% and errors fall by 30%.

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Advantages of Test Probe for ATE/ICT/FCT, OD 0.48~6.00 mm,

High Precision Diameter: Our Test Probe ranges from 0.48 to 6.00 mm in diameter, with an accuracy of ±0.01 mm. This precision ensures perfect alignment in any test, reducing errors and enhancing accuracy and stability.
Long-Lasting Durability: Each Test Pogo Pin lasts over 500,000 cycles without losing performance. This exceptional durability cuts down on replacement and maintenance costs, keeping your testing equipment running smoothly and saving you time and money.
Low Contact Resistance: Our Test Pogo Pins have contact resistance below 20 milliohms. This low resistance guarantees high signal fidelity and stability, providing more accurate data and improving test efficiency and reliability.
Quality Materials: Made from high-grade stainless steel and copper alloys, our Test Pogo Pins resist corrosion and maintain stable performance even in harsh conditions. This choice of materials ensures long-lasting reliability.
High Pressure Tolerance: The Test Pogo Pins s can handle up to 2000 grams of pressure thanks to their high elasticity. This means reliable contact in various test scenarios, reducing interruptions and boosting production efficiency.
Superior Gold Plating: With a 3-micron thick gold plating, our Test Probe offers excellent conductivity and wear resistance. This plating ensures consistent performance with frequent use, reducing the need for replacements.
Wide Temperature Range: Our Test Probe works in temperatures from -55°C to +155°C. This temperature flexibility means the probe handles extreme conditions with consistent performance, meeting diverse testing needs.

FAQ

1: What materials are used in Johoty’s Test Probe and why?
Johoty’s Test Probe is made from high-strength gold-plated beryllium copper or stainless steel. These materials ensure excellent conductivity and durability. Gold plating provides low resistance and corrosion resistance, extending the probe’s lifespan. Our materials guarantee precision and reliability for ATE/ICT/FCT tests within the OD 0.48~6.00 mm range. Each probe undergoes strict quality control to meet or exceed industry standards, offering stable and accurate test results.

2: What is the lifespan of Johoty’s Test Probe and how is its durability ensured?
Our Test Probe is designed to last up to 200,000 cycles, depending on usage conditions. We use advanced materials and manufacturing processes, like precision machining and multi-layer gold plating, to maintain top performance under frequent use. We also offer comprehensive after-sales support and technical guidance to maximize probe lifespan, reduce replacement frequency, and lower overall testing costs.

3: Is Johoty’s Test Probe compatible with various ATE/ICT/FCT equipment?
Yes, our Test Pogo Pin is designed to be compatible with most ATE/ICT/FCT equipment on the market. With an OD range of 0.48~6.00 mm, they cover various testing needs. We also offer custom solutions to fit specific equipment and applications, ensuring seamless integration and reliable testing performance.

4: How is the electrical performance of Johoty’s Test Probe and how is accuracy ensured?
Our Test Pogo Pins feature very low contact resistance and high conductivity, ensuring accurate and reliable test data. The test probe is rigorously tested for electrical performance to maintain stable current transmission even during high-frequency tests. We continuously refine our manufacturing process and materials to deliver top-quality test Pogo Pins for precise and efficient testing results.

5: How does Johoty’s Test Probe perform in high-temperature environments?
Our Test Probe is tested and optimized to perform efficiently under high heat. The gold plating and stainless steel construction provide excellent heat resistance, preventing deformation or failure under high temperatures. They excel in extreme conditions, ensuring accurate and stable test results.

6: Why choose Johoty’s Test Probe?
Choosing Johoty’s Test Probe means getting high performance and great value. Our high-tech manufacturing and rigorous quality control ensure that each test Pogo Pin surpasses industry standards. Our test probe is well-regarded internationally and highly rated by customers. We also offer flexible customization and comprehensive support to enhance your testing process. Opt for our test probe for outstanding performance and exceptional bang for your buck!