Crown + Round Spring Probe for IC chipset, OD 0.26~3.50 mm

Crown + Dome Spring Probe for IC chipset, OD 0.26~3.50 mm

Dome + Dome Spring Probe for IC chipset, OD 0.26~3.50 mm

Round + Round Spring Probe for IC chipset, OD 0.26~3.50 mm

Spring Probe for IC Chipset, 0.26~3.50, Best Design

Our Spring Probe for IC chip testing offers high accuracy and low contact resistance, working reliably in various complex environments. Ideal for large-scale production testing, It’s perfect for tech products and automotive tech. We provide custom solutions, fast delivery, and dependable after-sales support to help customers complete tests efficiently, enhancing product quality and market competitiveness.

Product Features:

High-precision dual-action structure ensures zero data error.
Long lifespan design greatly reduces replacement frequency.
Accurate contact with IC chips ensures stable conductivity.
Compatible with various chip sizes for wide applicability.
Corrosion-resistant ensures excellent long-term performance.
Customization services perfectly match customer testing needs.

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Spring Probe for IC Chipset, OD 0.26~3.50mm, Description

Product Info: The dual-ended spring probe for IC chips delivers top-notch performance thanks to its smart design and high-quality materials. Rigorously tested to last up to 100,000 uses, it ensures reliable results every time, maximizing your investment.
Product Features: This spring probe uses high-grade conductive materials for stable signal transfer and minimal contact resistance. Its unique dual-head design boosts testing efficiency by 30%, saving you valuable time and making tough testing tasks easier.
Problem Solved: In the fast-paced electronics world, test failures, and equipment glitches can cause major losses. Our spring probe reduces failure rates to just 0.05%, giving you confidence during critical moments and keeping production running smoothly.
Specifications: With a wide temperature range (-40°C to +125°C) and insulation voltage of up to 1,000V, this spring probe thrives in harsh environments. It maintains excellent performance under extreme conditions, meeting various testing needs.
Successful Applications: Our spring test probes are trusted by leading companies. For instance, a major smartphone maker saw a 40% boost in testing efficiency after using our product, significantly speeding up their time to market and enhancing profits.
Target Industries: This spring probe shines in consumer electronics, automotive tech, and medical applications. As the electronics industry expands at an impressive rate of up to 10% annually, it presents abundant opportunities for profitability.
Customer Benefits: Choosing the dual-ended spring probe for IC chips means higher testing efficiency and reliability, with a projected 20% cut in maintenance costs, making each test deliver more value and return for your business.

Spring Probe for IC Chipset, OD 0.26~3.50mm, Datasheet

No.#	Categories	Specification Range	Unit	Purpose	Benefits	Applications
1	Barrel OD	0.48~6.00	mm	*	*	*
2	Plunger OD	0.25~5.00	mm	*	*	*
3	Plunger Tips	Crown, Round, Sharp, Flat, Cup	*	*	*	*
4	Length	7.20~36.00	mm	*	*	*
5	Stroke	0.45~4.40	mm	*	*	*
8	Voltage Rating	12V, 20V, or custom	V	*	*	*
9	Current Rating	1.0, 2.0, 3.0 5.0.15.0, or custom	A	*	*	*
10	Spring Force	≥15	gf	*	*	*
11	1. Plunger Tips Categories	Crown	*	For applications requiring secure gripping or holding of test points.	Strong Grip: Multiple claws hold test points firmly. Surface Adaptability: Adjusts to surface shape changes.	ATE: For automated testing that needs gripping. ICT: Suitable for stable grip on electronic components. FCT: Ensures accurate functionality testing with stable contact.
12	2. Plunger Tips Categories	Round	*	Ideal for testing irregular surfaces or round pads.	Increases contact area for better surface interaction.Spreads pressure to minimize wear on the test point.	ATE: Ensures stable contact with various pad shapes. ICT: Handles irregular or uneven surfaces. FCT: Provides stable contact for functional checks.
13	3. Plunger Tips Categories	Sharp	*	Perfect for small or detailed test points.	High Precision: Targets small or hard-to-reach points accurately. Versatile: Reliable contact in tight spaces.	ATE: For high-precision automated testing. ICT: Effective in confined areas. FCT: Ensures precise contact for functionality tests.
14	4. Plunger Tips Categories	Flat	*	Ideal for flat pads or surfaces, providing uniform pressure.	Even Contact: Ensures uniform pressure across the test point. Broad Range: Works well on various flat surfaces.	ATE: Stable contact for automation. ICT: Effective on flat pads or large areas. FCT: Maintains consistent contact and testing stability.
15	5. Plunger Tips Categories	Cup	*	Best for large pads or surface-mount devices (SMD).	Excellent Contact: Adapts to surface variations with a larger contact area. Reduced Wear: Distributes pressure to extend probe life.	ATE: Stable contact for automation and calibration. ICT: Ensures good contact with large pads or SMDs. FCT: Guarantees reliable testing of modules.

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Our Spring Probe is reliable and durable, with a range of sizes and a precision of ±0.01 mm. We deliver on time with a 98% customer satisfaction rate. Choose us for quality and service that exceed your expectations.

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Spring Probe for IC Chipset, OD 0.26~3.50mm,, Applications

Micro IC Chip Testing
A tech company needs to test 0.26 mm micro IC chips. Accurate contact points and high stability are crucial. Using a 0.26 mm Spring Probe ensures precision. After 100,000 life tests, contact stability was confirmed. Failure rate dropped to 0.02%, and testing efficiency improved by 30%.
High-Power IC Module Testing
A manufacturer needs to test high-power IC modules. The main issues are size and heat management. The 3.50 mm Spring Probe ensures proper contact and heat dissipation. Each module went through 10,000 test cycles. Efficiency rose by 25%, and heat dissipation improved by 15%.
High-Speed IC Signal Testing
A telecom company needs to test high-speed IC chips. High-speed signals require very low contact resistance. The 1.00 mm Spring Probe guarantees low resistance. Conducted 10,000 signal tests with stable results. Signal integrity improved by 40%, and contact resistance dropped to 0.01Ω.
Low-Power IC Testing
A low-power device maker needs to test chip power consumption. Precision is key. The 0.50 mm Spring Probe was used for testing. Completed 10,000 low-power tests. Measurement error dropped to 0.005%, and testing efficiency increased by 20%.
Multi-Function IC Testing
A multi-function IC manufacturer needs to test various chip functions. Stable contact points are needed for multi-function tests. Using a 2.00 mm Spring Probe, each chip underwent 30,000 tests. Testing time was reduced by 35%, and pass rate reached 98%.
Large-Scale IC Production Line Testing
An electronics maker needs to test large volumes of ICs. Efficiency and stability are critical. The 2.50 mm Spring Probe is ideal for high-volume testing. Tests 200 ICs per hour. Efficiency increased by 50%, and production pass rate hit 99%.
High-Temperature IC Testing
An automotive electronics firm needs to test ICs in high temperatures. High-temperature testing demands robust equipment. The 1.50 mm Spring Probe is designed for high temperatures. Performed 10,000 tests at 200℃. Stability improved by 30%, and performance accuracy by 25%.
Low-Temperature IC Testing
A polar research institute needs to test ICs in low temperatures. Low-temperature testing requires specialized equipment. The 1.20 mm Spring Probe works well in cold environments. Conducted 8,000 tests at -40℃. Reliability increased by 20%, and performance improved by 15%.

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Advantages of Spring Probe

1. High Precision Testing: Our Spring Probe ranges from 0.26 mm to 3.50 mm, meeting all IC chip testing needs with 99.9% accuracy. This precision greatly reduces errors and enhances test quality.

2. Long Lifespan: Each Spring Probe is rigorously tested for durability, lasting over 100,000 cycles, even 200,000 cycles. This means fewer replacement jobs and lower maintenance costs.

3. Excellent Contact Performance: Made with advanced materials, our Spring Probe has a contact resistance as low as 15 milliohms, ensuring stable signal transmission and reliable test results.

4. Versatile Application: With diameters from 0.26 mm to 3.50 mm, our Spring Probe fits various IC chips, from tiny to large, making your testing system highly adaptable.

5. Superior Conductivity: Gold-plated Spring Probe offers 98% conductivity, ensuring stable and accurate current transmission, and boosting testing efficiency.

6. Outstanding Wear Resistance: Our Spring Probe is made from wear-resistant materials with a wear rate below 0.01%, performing reliably even in high-frequency testing environments.

7. Fast Response Time: Each probe responds in just 1 nanosecond, speeding up your tests and improving production line efficiency.

8. Easy Installation and Replacement: Designed for convenience, installing or replacing our Spring Probe takes only 30 seconds, reducing downtime and making your testing process smoother.

FAQ

1: What IC chips can Johoty’s Spring Probe test?
Our Spring Probe tests a wide range of IC chips, from very small to large, with diameters from 0.26 to 3.50 mm. We use precise manufacturing techniques to ensure accuracy and stability, so they perform reliably in complex circuits. We’ve served over 300 companies worldwide, including top electronics manufacturers and IC designers. Choosing us means choosing efficiency and precision to enhance your product’s quality and market edge.

2: How durable is Johoty’s Spring Probe?
Our Spring Probe lasts for at least 100,000 uses, for surpassing industry standards. We use durable metal alloys and high-quality coatings to ensure our items are long-lasting and resist everyday wear and tear. With a failure rate below 0.01%, they significantly reduce test interruptions and extra costs. High durability and stability mean less worry and better testing efficiency.

3: What makes Johoty’s Spring Probe unique?
Johoty’s Spring Probe is known for its precision and long lifespan, plus a unique elastic design for stable contact and accurate testing during high-frequency use. We offer customization for length, diameter, and elasticity. Clients report a 20% boost in testing efficiency and a 15% increase in pass rates. Our CFT team is available 24/7 to resolve any issues promptly. Choosing Johoty means excellent performance and hassle-free service.

4: Does Johoty’s Spring Probe meet industry standards?
Yes, our Spring Probe adheres to international standards like ISO 9001 and RoHS for safety and environmental protection. Each batch undergoes a 100% quality check before shipping. They are used in demanding industries like space aerospace, healthcare medical, and communications, and are trusted by many clients. With us, you get a high-quality Spring Probe that meets top industry standards, boosting your product’s market competitiveness.

5: Are Johoty’s Spring Probe competitively priced?
We lower production costs through optimized processes and bulk material purchases, offering competitive prices. Our prices are about 10% lower than similar spring proble on the market, however, Johoty’s spring probe has superior quality and performance. Customers find that our Spring Probe reduced procurement costs and minimized additional expenses from probe damage. We aim to provide the best value, giving you the edge you need to succeed in a crowded field.

6: What is Johoty’s delivery time?
We use advanced automation to handle large orders quickly. Standard Spring Probe ships in 5-7 business days, and custom Spring Probe in 10-15 business days. With a large inventory, we can quickly respond to urgent orders. Our on-time delivery rate is 98%, ensuring smooth production schedules. Choose us for an efficient and reliable supply chain partner, with solid delivery guarantees.